Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions
نویسندگان
چکیده
We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip-surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.
منابع مشابه
Sensitivity Analysis of Frequency Response of Atomic Force Microscopy in Liquid Environment on Cantilever's Geometrical Parameters
In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...
متن کاملHigh-speed atomic force microscopy in slow motion--understanding cantilever behaviour at high scan velocities.
Using scanning laser Doppler vibrometer we have identified sources of noise in contact mode high-speed atomic force microscope images and the cantilever dynamics that cause them. By analysing reconstructed animations of the entire cantilever passing over various surfaces, we identified higher eigenmode oscillations along the cantilever as the cause of the image artefacts. We demonstrate that t...
متن کاملDevelopment and Applications of Multifrequency Imaging
Title of Dissertation: DEVELOPMENT AND APPLICATIONS OF MULTIFREQUENCY IMAGING AND SPECTROSCOPY METHODS IN DYNAMIC ATOMIC FORCE MICROSCOPY Gaurav Chawla, Doctor of Philosophy, 2011 Dissertation directed by: Assistant Professor Santiago D. Solares, Department of Mechanical Engineering Force spectroscopy and surface dissipation mapping are two of the most important applications of dynamic atomic f...
متن کاملGeneralized Hertz model for bimodal nanomechanical mapping
Bimodal atomic force microscopy uses a cantilever that is simultaneously driven at two of its eigenmodes (resonant modes). Parameters associated with both resonances can be measured and used to extract quantitative nanomechanical information about the sample surface. Driving the first eigenmode at a large amplitude and a higher eigenmode at a small amplitude simultaneously provides four indepen...
متن کاملUncertainty Quanti cation in Calibration of AFM Probes Due to Non-uniform Cantilevers
For more than two decades, the Atomic Force Microscope (AFM) has provided valuable insights in nanoscale phenomena, and it is now widely employed by scientists from various disciplines. AFMs use a cantilever beam with a sharp tip to scan the surface of a sample both to image it and to perform mechanical testing. Since the AFM measures the de ection of the probe beam, one must rst nd the spring ...
متن کامل